Applied Beams

Applied Beams is the leading supplier of direct replacement consumables for scanning electron microscope (SEM), focused ion beam (FIB) and FIB-SEM process diagnostic and manufacturing tools. As customer-oriented professionals, they apply expertise to deliver high performance products for your SEM, FIB and FIB-SEM systems at affordable price levels. They understand the customer’s need for a complete solution – from delivery to installation to service and applications support.

Product Line Highlights

• CFIB & SEM Consumables
• FIB & SEM Systems
• HyperFIB and Plasma FIB
• SEM & AFM Systems